Microscopy

MOEP-03	Calibration of Scanning Probe Microscopes using 2-D Symmetry	Peter Moeck
MOEP-01	Calibration of Scanning Probe Microscopes using Nanometrology Devices	Peter Moeck
MOEP-02	Nanocrystal Structure Identification using Fingerprint Database	Peter Moeck
MOEP-04	Nanocrystal Structure Identification using Precession Electron Diffraction	Peter Moeck
LARA-01	Shear-Force Ultrasonic Near-Field Microscope	Richard Nordstrom, Andres LaRosa, Xiquan Cui, Sudhaprasanna Padigi